Fault Injection System (FIS)
Generate defined errors. Reliably validate electronic systems.
The modular Fault Injection System FIS0100 generates realistic electrical faults in data, signal, and power connections. Application-specific modules connect the system directly to the required interfaces and connectors.
Generate specific errors.
Reliably validate system behavior.
Validating Electronic Systems Under Defined Failure Conditions
To validate electronic components and systems in accordance with OEM specifications and relevant standards, it must be possible to reproducibly generate defined electrical faults during operation. These include, for example, open circuits and short circuits to GND, VBAT, the shield, or between individual signal lines.
The modular FIS0100 fault injection system supports testing tasks such as those that may arise in the context of LV 124, LV 148, ISO 16750, and ISO 7637, among others. The system is integrated into the actual data, signal, or power connection between the “Device Under Test” (DUT) and its connected component (IO) or the test system.
Interchangeable function modules are selected to match the respective interface, the actual connector, and the required fault conditions. The faults can be triggered reproducibly, either manually or through a higher-level test automation system.
What is a fault injection system?
A fault injection system—also known as a fault insertion unit (FIU) or fault box—generates realistic electrical faults in a connection between a device under test and its environment. This allows testing how an electronic component or an entire system responds to open circuits, short circuits, and defined fault conditions.
The FIS0100 operates normally when in the “closed” state and sets a selected error condition upon command. Unlike a purely software-based error simulation, the error occurs directly on the connected physical line.
What applications is the FIS0100 designed for?
Today’s applications focus particularly on the validation of automotive cameras, displays, control units, automotive video links, automotive Ethernet, and CAN connections. The FIS0100 supports the reproducible generation of defined electrical faults, as may be required by OEM test specifications and relevant standards. Typical users include development and validation teams at Tier 1 suppliers and, in some cases, at OEMs.
The platform is not limited to the automotive industry. With additional functional modules, the FIS0100 can also be adapted in the future to interfaces, connectors, and fault requirements in other industrial sectors. It is therefore primarily intended for component manufacturers, system suppliers, OEMs, test laboratories, and test bench operators who investigate the behavior of electronic systems under defined real-world line faults.
Defined fault conditions for actual lines
Depending on the module used, the FIS0100 can open a connection or connect it specifically to defined fault potentials. A uniquely defined state is selected for each channel. The internal control logic prevents unintended combinations of individual switching contacts. Multiple channels can be switched to different error states simultaneously.
Potential for Errors Due to Flexibility
GND, VBAT, and Common are supplied to the system as external fault potentials. While GND and VBAT are typically used to simulate short circuits to ground or the supply voltage, Common is available as a freely usable fault potential.
In addition, the Common terminal can be used as a shared connection point for multiple channels. This allows signals from different modules or lines to be selectively short-circuited with one another without having to apply an external potential to Common. This enables the simulation of signal-to-signal short-circuits across module boundaries.
The “Short to Shield” condition, on the other hand, always refers to the cable shield at the DUT connector of the respective module and is provided within the module.
Test differential circuits independently
With differential interfaces, the two signal lines can be switched independently of one another. For example, a single line can be opened or specifically connected to GND, VBAT, Common, or—depending on the module—Shield. Additionally, a short circuit can be created between the two lines.
Defined Behavior During Operation
Passive Closed State
In the “Closed” state, the normal connection between the DUT and I/O jacks is established. The connected signal path can be used normally without the FIS0100 entering an error state. Depending on the module used, the closed connection is also designed for high-speed signals with frequencies of 3 GHz and above.
The current modules use electromechanical relays. As a result, the closed connection remains intact even when the FIS0100 is turned off. After power-up, the modules are also initialized in the closed state.
Externally Controlled Test Automation
The FIS0100 receives individual switching commands from a higher-level control or test software and implements the selected state on the corresponding module. Sequence control, wait times, repetitions, and other test logic are implemented in the customer’s automation environment.
Modular Architecture for Changing Test Tasks
The FIS0100 is designed as a 19-inch system with a height of 1U and features eight module slots. The modules can be freely combined to meet the required interfaces, connectors, and error-handling functions.
The modules currently available each occupy one slot. Modules with two or four slots are planned for future, more extensive functionality. If more than eight slots are needed, multiple FIS0100 units can be combined via Ethernet to form a larger system. The system does not specify a fixed upper limit for this.
Module Replacement and Automatic Detection
The modules are mounted on guide rails and can be replaced by the user. The FIS0100 base system does not need to be powered off to do this. When removed, the module in question automatically switches to the “Closed” state. A newly inserted module is automatically detected, initialized, and assigned to the slot in use. It is then available via USB, Ethernet, and the optional touchscreen interface.
Custom alias naming and front panel labeling
An individual alias name can be assigned to each module. If desired, these alias names can also be engraved directly on the front panel of the module, which ensures quick identification and improved user-friendliness in larger test configurations.
Basic and Advanced Modules
The FIS0100 can be adapted to specific test tasks using various module types. The most important functional distinction is the side on which an error can be generated.
Basic Modules generate errors on the DUT side. Advanced Modules can generate the selected error condition on the DUT side, on the I/O side, or on both sides simultaneously. The description of each module specifies which additional measurement, filtering, or power supply functions are available.
Control and Integration
The FIS0100 can be flexibly integrated into existing test environments and test benches. Depending on the application, various control options are available. From a direct USB connection with a documented command interface to network integration via REST API, as well as browser-based operation or a locally connected touchscreen monitor, the system can be used in both development environments and automated test systems.
Custom Interface Modules
If a required connector, a specific pin configuration, or an additional electrical function is not covered by an existing standard module, TZ can develop a module tailored to the application. This preserves the FIS0100 platform while adapting the interface to the customer’s actual test setup.
Module Overview
Basic Modules to inject Failures on DUT side
• Open
• DUT short to “GND”
• DUT short to “+VBAT”
• DUT short to “Common”
• DUT short to “Shield”
FPD-Link III/IV
APIX
GVIF
• Open
• DUT short to “GND”
• DUT short to “+VBAT”
• DUT short to “Common”
• DUT short to “Shield”
FPD-Link III/IV
APIX
GVIF
• DUT D+, DUT D- Open
• DUT D+ , DUT D- short to „GND“
• DUT D+, DUT D- short to „+VBAT“
• DUT D+, DUT D- short to „Common“
• DUT D+, DUT D- short to “Shield“
• Short to each other (DUT D+ to DUT D-)
FPD-Link III/IV
APIX
GVIF
100/1000 BASE-T1
2.5/5 GBASE-T1
• Open
• DUT short to “GND”
• DUT short to “+VBAT”
• DUT short to “Common”
• DUT short to “Shield”
FPD-Link III/IV
APIX
GVIF
• Open
• DUT short to “GND”
• DUT short to “+VBAT”
• DUT short to “Common”
• DUT short to “Shield”
FPD-Link III/IV
APIX
GVIF
• DUT D+, DUT D- Open
• DUT D+ , DUT D- short to „GND“
• DUT D+, DUT D- short to „+VBAT“
• DUT D+, DUT D- short to „Common“
• DUT D+, DUT D- short to “Shield“
• Short to each other (DUT D+ to DUT D-)
FPD-Link III/IV
APIX
GVIF
Advanced Modules to inject Failures on DUT and IO side
• Open
• Filtered Open (for
current measurement without shunt)
• DUT / IO short to “GND”
• DUT / IO short to “+VBAT”
• DUT / IO short to “Common”
• DUT / IO short to “Shield”
• Open
• Filtered Open (for
current measurement without shunt)
• DUT / IO short to “GND”
• DUT / IO short to “+VBAT”
• DUT / IO short to “Common”
• DUT / IO short to “Shield”
• Open
• Filtered Open (for
current measurement without shunt)
• DUT / IO short to “GND”
• DUT / IO short to “+VBAT”
• DUT / IO short to “Common”
• DUT / IO short to “Shield”
• Open
• Filtered Open (for
current measurement without shunt)
• DUT / IO short to “GND”
• DUT / IO short to “+VBAT”
• DUT / IO short to “Common”
• DUT / IO short to “Shield”
• Open
• Filtered Open (for
current measurement without shunt)
• DUT / IO short to “GND”
• DUT / IO short to “+VBAT”
• DUT / IO short to “Common”
• DUT / IO short to “Shield”
• Open
• Filtered Open (for
current measurement without shunt)
• DUT / IO short to “GND”
• DUT / IO short to “+VBAT”
• DUT / IO short to “Common”
• DUT / IO short to “Shield”
Digital Interfaces
• CAN H Open
• CAN L Open
• CAN H/L Open
• CAN H short to „GND“
• CAN L short to „GND“
• CAN H/L short to „GND“
• CAN H short to „+VBAT“
• CAN L short to „+VBAT“
• CAN H/L short to „+VBAT“
• CAN H short to „COMMON“
• CAN L short to „COMMON“
• CAN H/L short to „COMMON“
• Short to each other
(CAN H to CAN L)
• 120Ohm Termination on Default
Line on/off (Closed termination on)
ISO 11898-2, ISO 11898-3)
CAN FD
Main Controller
Optional extensions
TZ Electronic Systems GmbH offers various fault injection systems. If your combination of requirements is not included, we will be happy to implement a solution that meets your specific requirements. Request a concrete offer in our online store, download our complete product overview or contact our technical customer service for non-binding advice on our comprehensive test solutions.
FAQ
What is the FIS0100?
The FIS0100 is a modular hardware platform designed to intentionally induce real electrical faults in data, signal, and power connections. It is inserted between the DUT and the connected component or test system.
How does the FIS0100 differ from a relay switching matrix board?
The FIS0100 uses application-specific plug-in modules whose connectors, signal routing, and error conditions are tailored to the actual interface. This reduces the need for additional adapters, breakout boards, and custom cabling.
Is the FIS0100 only suitable for automotive applications?
No. Current applications are primarily in automotive cameras, ADAS systems, displays, ECUs, and related interfaces. The modular platform can also be expanded to serve other industries through the addition of modules.
What error conditions does the FIS0100 support?
Depending on the module, the following options are available: Closed, Open, Short to GND, Short to VBAT, Short to Common, Short to Shield, and, for differential lines, Short to Each Other.
What does "Common" mean?
The common terminal serves as a common reference point for fault conditions that require, for example, an additional external potential in order to generate faults such as short circuits to that additional potential.
In addition, the common terminal can also be used to connect signals from different modules to one another. In this case, no external potential needs to be applied to common. Instead, Common serves as an internal connection point through which, for example, two signal lines can be selectively short-circuited. This also allows for the simulation of fault conditions in which signals are short-circuited to each other without a connection to ground or the supply voltage.
What does "Short to Shield" mean?
The selected DUT lead is connected to the shield of the cable connected to the DUT connector. The shield potential is available within the respective module.
Can differential lines be switched individually?
Yes. The individual conductors of a differential pair can be switched independently and connected to the available fault potentials. In addition, a short circuit can be created between the two conductors.
Can multiple channels generate errors at the same time?
Yes. Multiple channels can be switched simultaneously to different predefined error states.
What is the difference between Basic and Advanced Modules?
Basic Modules generate errors on the DUT side. Advanced Modules can generate errors on the DUT side, the I/O side, or both sides simultaneously.
What happens when the FIS0100 is turned off?
When the device is turned off, the closed connection between the DUT and I/O jacks remains intact.
What happens if a USB or Ethernet connection is interrupted?
The last switching state set remains active until a new command is transmitted or the FIS0100 is turned off.
Can customers replace modules themselves?
Yes. The modules are mounted on guide rails and can be replaced by the user. The base system does not need to be shut down for this; the module-specific operating conditions must be observed.
Are new modules detected automatically?
Yes. An installed module is automatically detected, initialized, and assigned to the slot in which it is installed. It is then accessible via the available control methods.
How many modules fit in a FIS0100?
A FIS0100 has eight module slots. Current modules occupy one slot; future, more complex modules may occupy two or four slots.
How is the FIS0100 controlled?
USB is intended for direct control. Ethernet and local touch control are available as options.
Does the FIS0100 support automated testing?
Yes. A higher-level test software sends individual control commands to the FIS0100. Sequence control, wait times, and repetitions are implemented in the customer’s automation environment.